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IBIS Behavioral Models:
Micron has been a member of the IBIS Open Forum for many years and fully supports the IBIS specification. IBIS models for most Micron products are available for download from the Micron Web site.
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TN-00-07
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11/2009
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163.98 KB
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Technical Note
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Thermal Applications:
Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature
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TN-00-08
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05/2010
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252.18 KB
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Technical Note
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Understanding Quality and Reliability Requirements for Bare Die Applications:
Describes the quality and reliability requirements for bare die applications
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TN-00-14
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10/2009
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152.83 KB
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Technical Note
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Recommended Soldering Parameters:
Defines the recommended soldering techniques and parameters for Micron Technology, Inc., products.
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TN-00-15
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03/2007
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69.09 KB
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Technical Note
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Uprating of Semiconductors for High-Temperature Applications:
Describes the issues associated with temperature uprating and the risks involved in using components and/or systems outside the manufacturer's environmental specifications
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TN-00-18
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05/2010
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428.33 KB
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Technical Note
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Understanding Signal Integrity:
Describes how memory design, test, and verification tools can be used to the greatest advantage, from conception of a new product through end of life
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TN-00-20
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12/2009
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1.52 MB
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Technical Note
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SEMI Wafer Map Format:
Micron has adopted the wafer map file format approved by Semiconductor Equipment and Materials International (SEMI). With SEMI formatting, Micron's customers can be confident they will always receive consistent, compatible, reliable map files.
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TN-00-21
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02/2009
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110 KB
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Technical Note
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Thinning Considerations for Wafer Products:
Information on optimal wafer-thinning processes to meet specific customer requirements
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TN-00-19
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10/2009
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73.58 KB
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Technical Note
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LVTTL Derating for SDRAM Slew Rate Violations:
Describes the proper setup and hold time derating when the slew rate during transition time violates specification.
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TN-48-09
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11/2009
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196.24 KB
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Technical Note
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Backward Compatibility for Faster SDRAM:
Reviews the timing differences between SDRAM generations and shows how the faster Micron parts are compatible with the slower parts
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TN-48-15
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10/2005
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79.21 KB
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Technical Note
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PCN/EOL Systems:
Explains Micron's product change notification and end-of-life systems.
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CSN-12
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08/2009
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75.58 KB
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Customer Service Note
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Wafer Packaging and Packaging Materials:
Provides complete shipping and recycling information about each of the materials used for shipping Micron's products.
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CSN-20
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09/2011
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776.24 KB
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Customer Service Note
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Bare Die SiPs and MCMs:
Describes design considerations for bare die SiPs and MCMs.
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CSN-18
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04/2009
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151.06 KB
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Customer Service Note
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Shipping Quantities:
Provides tables of part quantity.
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CSN-04
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10/2011
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463.55 KB
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Customer Service Note
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Micron KGD Definitions:
Describes the testing specifications and parameters for Micron's KGD-C1 and KGD-C2 DRAM die.
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CSN-22
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07/2009
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65.52 KB
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Customer Service Note
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Proper Handling Procedures for Modules:
Includes procedures for how to properly handle modules.
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CSN-23
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12/2007
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1.02 MB
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Customer Service Note
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Micron Component and Module Packaging:
Explanation of Micron packaging labels and procedures.
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CSN-16
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02/2012
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840.61 KB
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Customer Service Note
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ESD Precautions for Die/Wafer Handling and Assembly:
Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.
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CSN-24
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08/2010
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119.08 KB
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Customer Service Note
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Electronic Data Interchange:
Describes EDI transmission sets, protocol, and contacts.
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CSN-06
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09/2005
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53.5 KB
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Customer Service Note
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RMA Procedures for Packaged Product and Bare Die Devices:
Outlines standard returned material authorization (RMA) procedures, as well as the differences associated with bare die RMAs.
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CSN-07
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10/2010
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82.64 KB
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Customer Service Note
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ISO System Management Standards:
Describes ISO system management standards.
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CSN-08
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04/2004
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39.18 KB
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Customer Service Note
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The Future of Memory and Storage:
Overview of trends for main memory and Flash memory
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12/2009
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1.54 MB
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Presentation
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Interfacing SDRAM Devices with Motorola's MPC8xx:
Describes how to interface SDRAM devices with Motorola's MPC8xx
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TN-48-12
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12/2001
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176.99 KB
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Technical Note
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Designing in SDRAM for Future Upgrades:
Describes how to design in SDRAM for future upgrades
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TN-48-08
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03/2004
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126.15 KB
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Technical Note
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Designing Competitive DDR Platforms:
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11/2009
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2.64 MB
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Presentation
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SDRAM System-Power Calculator:
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11/2009
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54 KB
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Power Calculator
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DRAM Component Part Numbering System:
Part numbering guide for DDR3/DDR2/DDR/SDR SDRAM, Mobile LPDRAM, and RLDRAM components
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02/2012
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39.77 KB
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Part Numbering Guide
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FBGA Date Codes:
Date codes for FBGA-packaged components
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08/2005
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22.36 KB
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Part Numbering Guide
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Accelerate Design Cycles with Simulation Models:
Micron supplies the tools and guidelines necessary to verify new designs prior to layout. This technical note discusses software model support, signal integrity optimization, and logic circuit design.
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TN-00-09
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02/2010
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206.91 KB
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Technical Note
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Design Guide - Dealing with DDR2/DDR3 Clock Jitter:
Explores DDR2/DDR3 clock jitter specifications and provides guidance on how to apply them and how to deal with violations
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TN-04-56
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09/2008
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272.53 KB
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Technical Note
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Micron Wire-Bonding Techniques:
This technical note provides guidance on wire bonding techniques for both nickel-palladium (NiPd) and aluminum (Al) bond pads on Micron products.
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TN-00-22
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11/2010
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66.13 KB
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Technical Note
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Industrial and Multi-Market Applications Flyer:
Our extensive and stable portfolio of IMM-focused memory solutions empower technology developments in automotive, industrial, medical, manufacturing, and other multi-market segments.
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Product Flyer
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08/2011
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593.95 KB
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Product Flyer
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Micron BGA Manufacturer's User Guide:
Provides information to enable customers to easily integrate both leading-edge and legacy Micron's ball grid array (BGA) packages into their manufacturing processes. It is intended as a set of high-level guidelines and a reference manual describing typical package-related and manufacturing process-flow practices.
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CSN-33
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07/2011
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353.32 KB
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Customer Service Note
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SDRAM I/O Characteristics Comparison of 54nm to 130nm Die:
This technical note compares the I/O characteristics of the 54nm to the 130nm single data rate (SDR) synchronous dynamic random access memory (SDRAM) die.
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TN-00-24
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08/2011
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515.31 KB
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Technical Note
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Product Marks/Product and Packaging Labels:
Explains product part marking, and product and packaging labels.
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CSN-11
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02/2012
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666.83 KB
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Customer Service Note
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Bypass Capacitor Selection for High-Speed Designs:
Describes bypass capacitor selection for high-speed designs.
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TN-00-06
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03/2011
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481.9 KB
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Technical Note
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